Thermal Analysis: Dupont 9900 thermal analysis equipment: DSC, TMA, TGA and DMA; Perkin-Elmer 7 Series DSC, TGA and TMA; Perkin Elmer-2400 CHN elemental analyzer; HP 35852A data acquisition system with 80 channel input and 4 channel signal analyzer; Dantee single channel Laser-Doppler Anemometer; high pressure water pump (350psi); High pressure compressor(200psi)

Microscopy: JEOL-1200EX scanning transmission electron microscope with Link AN 10000 EDAX system and backscattered detector; Cambridge Stereoscan 120 scanning electron microscope with KEVEX Delta I energy dispersive spectroscopy system; JEOL JSE-35 scanning electron microscope with Tracor Northern 2000EDS system; CAMICA^TM Electron Microprobe with XPS, BackScattered & Secondary Electron Detector; KRONOS^TM Auger Electron Microscope; solid state specimen preparation equipment for electron microscopy; ISI 60 scanning electron microscope; optical microscopy; Porter-Blum ultramicrotome; Anatech Hummer VI-A vapor deposition unit; Edwards carbon deposition unit; Lecomt^TM materials sectioning unit.

Processing: Thermal Equipment Corp. computerized autoclave (850^oF, 325 psi, 3^' x 6^' internal size); Carver hot press; United McGrill autoclave (850^oF, work area 13^'' x 13^'' x 36^''); hot wire anemometer system.

Mechanical Testing: 100, 20, 5 kip MTS and Instron servohydraulic test systems; 2.5 kip Instron high-rate servohydraulic system; computerized data acquisition system; ATS high temperature furnace with 3 and 4 point SiC bend fixtures for the 20 kip Instron servohydraulic machine; QM-1 high powered telescope system from Questar to monitor crack growth; high density video camera, video monitor and recorder to record crack growth information.

Damage Characterization Facilities: Cabinet X-ray System; Ultrasonic Imaging System.

Sensing and Control Facilities: laser vibrometer; instrumented impact facilities; concurrent real time Unix work station; high voltage amplifiers for piezoceramic actuators; multimeter and function generators.

Surface Analysis: front view low energy electron diffraction system; reverse view low energy electron diffraction system; electron induced auger electron spectrometer; positron annihilation induced auger electron spectrometer; ultra-high vacuum scanning tunneling microscope; air environment scanning tunneling microscope; Perkin-Elmer X-ray photoelectron spectrometer.

University Wide computational Capabilities: (to be updated soon).

Mechanical and Aerospace Engineering Computational Capabilities: (to be updated soon)